| Usage: | Electric safety test |
|---|---|
| Power: | Electronic |
| Model Number: | CX-2B |
| Brand Name: | Chuagnxin |
| Place of Origin: | China (Mainland) |
| Material: | Delrin and steel |
| Standard: | IEC61032, IEC60335, IEC60065 etc. |
Quick Details
Specifications
IEC 61032 Jointed Test Finger
This is the "international test finger required by most IEC, EN and CSA standards, in addition to many UL standards. The Jointed Finger Probe is a high-precision probe built in exact accordance with IEC standards such as IEC 60950, IEC 61010, and is also used for CSA and UL. Standards. It features a palm simulator to prevent misuse, and restricted join movement which simulated human finger movement. The finger is made of chrome-plated steel and the rest of the instrument is Delrin.
This is the "international test finger required by most IEC, EN and CSA standards, in addition to many UL standards. The Jointed Finger Probe is a high-precision probe built in exact accordance with IEC standards such as IEC 60950, IEC 61010, and is also used for CSA and UL. Standards. It features a palm simulator to prevent misuse, and restricted join movement which simulated human finger movement. The finger is made of chrome-plated steel and the rest of the instrument is Delrin.
This is the only finger probe available with s integral jack in the handle for continuity testing.
Conforms to:
The IEC Jointed Finger Probe is conform to the standard IEC 61032-1997, IEC 60529-2001, GB/T4208-2008, IEC 61010, IEC 60601, EN 60529, EN 60950, IEC 60950, EN 61010, CSA 950 and UL 60950 etc.
Notes:
Both joints shall permit movement in the same plane and the same direction through an angle of 90o with a 0o to +10o tolerance.
Technical Parameters:
| Kunrled finger diameter | 12mm |
| Knurled Finger length | 80mm |
| Baffle plate diameter | 50mm |
| Baffle plate length | 100mm |
| Baffle thickness | 20mm |
Picture:
Finger part:
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