XJL-301 reflected metallurgical microscope can be used for brightfield, darkfield, simple polarzing observations. It is the ideal instruments for inspecting semiconductors, packages, electronics substrates, materials

Features     

With long working distance plan achromatic objectives  (no cover glass) and wide-field eyepieces, can get clear pictures and wide view field

With large move range mechanical stages,moving range:8"×8"( 204mm× 204mm)

Coaxial coarse/fine focus system, with tensional adjustable and up stop, minimum division of fine focusing: 0.8μm

6V 30W halogen lamp, adjustable brightness

Trinocular, can switch to normally/polarize observation, brightfield/darkfield observation. can send 100% of light to the binocular eyepieces or to the top port