Minimum load cell verification interval (Vmin) Sensitivity (Cn) Zero balance Temperature effect on sensitivity (TKc)
* Temperature effect on zero balance (TKo) Non-linearity (dlin)
* Repeatability (drep)
* Hysteresis error (dhy)
* Creep (dDR)in 30 min. Input resistance (RLC) [Red(+)-black(-)] Output resistance (RO) [Green(+)-white(-)] Reference excitation voltage (Uref) Maximal excitation voltage Nsulation resistance (Ris) Nominal temperature range Service temperature range Storage temperature range |
% of Cn mV/V mV/V % of Cn/k % of Cn/k % % % % Ω Ω V(DC/AC) V(DC/AC) GΩ ℃[oF] ℃[oF] ℃[oF] |
0.1 2±1% ±0.04 < ±0.0023 < ±0.0120 < ±0.050 < ±0.030 < ±0.050 < ±0.050 770 ±30 700±5 0.5…24 36 >2[50 VDC ] -10…+40[15…+105] -30…+70[-20…+160] -50…+85[-60…+185] |