Applicaitions:
Electric performance test and on the file for Mono-Si or Poly-Si solar cells.
Equipment Features:
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Pneumatic bumper pin-contact, Pin-contact, on the sunny side and planer contact on the rear side;
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4-strand testing mode and 14-byte 4-channel high-speed synchronous acquisition;
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10 preferences on display and testing data illustration in terms of sheets and curves;
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Irradiance and temperature self compensating;
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Vocal test reporting and screen counter for flashes;
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High reliable, high precision, high efficiency;
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24/7 tools uptime and 100,000 flashes for life-time of Xenon lamp
Technical Specification:
Items |
GSCT-B |
Lamp Spectrum |
IEC60904-9 and JISC8933 |
Light intensity
|
100mW/cm²(20~120mW/cm² continuous adjustable )
|
Uniformity of Irradiation
|
≤3%
|
Instability of Irradiation
|
≤2%
|
Consistency of Testing
|
≤1%
|
Pulse Width of Single Flash
|
10 ms
|
Effective Testing Area/Watts
|
200mm×200mm 0.1W~5W
|
Measuring voltage
|
0~0.8V (resolution 1mV)
|
Measuring current |
0~20A (resolution 1mA) |
Test Parameters
|
Isc,Voc,Pmax,Vm,Im,FF,EFF,Temp,Rs,Rsh,Ir |
Data acquisition
|
4-bit 4-channel high-speed synchronous acquisition card
|
Options:
Special design for 2 Bus-bar, 3 Bus-bar, or other cell metallization forms orientated as options.