1. Product overview
Modularity digital electronic export experiment box constitutes by mother board and expansion board, expansion board is fixed with four copper pillars, convenience for plug-in mounting in mother board to operated experiment, motherboard can plug-in four expansion board to operate experiment at same time. Experiment box’s mother board integrated with power supply, signal source, logic level switch, display circuit, bread board, discrete components, basic gate circuit, commonly trigger etc.; expansion board cover most digital-electronic experiments, can configure as requirements.
2. Technical parameters
1, Overall dimensions: 485mm*320mm*190mm
2, Power supply
Ø Single phase: AC220V
Ø Power supply ≤12W
Ø With power supply indication
Ø With ground protection
Ø With overcurrent protection
3. Experiment power supply
Ø DC+12V,1A
Ø DC-12V, 0.5A
Ø DC+5V,0.5A
Ø DC1.25～10V,0.5A
3, Working environment: Temperature -10℃～+40℃ Relative humidity＜80％(25℃)
3. Product structure:
1. Experiment box’s mother board includes:
1) Power supply module;
2)Fixed-frequency output: 1MHz, 100KHz, 10KHz, 1KHz, 100Hz, 10Hz, 2Hz, 1Hz;
3)1Hz～500KHz continuous impulse 6 grades output;
4)Plus-minus single-pass pulse output;
5)Amplitude, frequency adjustable sine wave, triangular wave, square wave;
6)12 ways logical lever output;
7)8 ways LED light and 10 ways LED streamer output display;
8)Buzzer and logic pen test circuit;
9)Common cathode and common anode nixie tube display circuit, independent nixie tube module;
10) Basic logic gate and RS,JK,D trigger circuit;
11)Discrete component library, breadboard, dial switch;
12)Binary’s counter circuit.
2. Experiment box extended module includes:
1) AD training module
2) DA training module
3) ROM training module
4) RAM training module
5) ALU training module
6) IC extended module
7) CPLD training module
4. Product feature:
Practicable experiment basic overlay all digital electronic course’s experiments, by extended module can more distinct and simple verify certain knowledge point, can according customer’s requirement configure or update to certain functional experiment module.
5. Achievable experiment
1. Mother board experiment
Experiment 1. Semiconductor diode, dynatron switching characteristic;
Experiment 2. Discrete component logic gate circuit;
Experiment 3. TTL integrated logic gate’s logic function and parameter test
Experiment 4. CMOS integrated logic gate’s logic function and parameter test
Experiment 5. TTL collector open-collector gate and three state output gate’s application
Experiment 6. Combinational logic circuit
Experiment 7. Decoder and its application
Experiment 8. Numeric comparison experiment
Experiment 9. Trigger and its application.
Experiment 10. Enumerator and its application.
Experiment 11. Sequential logic circuit’s design and its application
Experiment 12. Pulse signal producing circuit
Experiment 13. Pulse delay and waveshaping circuit.
Experiment 14 555 time-base circuit and its application
2. Expansion experiment
Experiment 15 Arithmetic logic unit experiment
Experiment 16 Digital-to-analogue conversion
Experiment 17 Analog-digital conversion circuit
Experiment 18 RAM experiment
Experiment 19 ROM experiment
Experiment 10 CPLD programming experiment