The SD solution is designed for test, debug, validation, and programming of eMMC, eMCP devices

 The SD solution provides a compact test solution for eMMC, eMCP devices used in applications suchas handheld, mobile, and TV product development. 

 - Suitable for devices of  Samsung, Hynix, Sandisk, Toshiba, Intel, Kingston etc eMMC and eMCP.
- Support eMMC version: ≤eMMC5.0.
- Support hot plug, eMMC can be directly connected to PC with SD card reader.
- Realize reading, accessing and writting data for eMMC and eMCP devices 

Advantages: 
Patent Technology 1: Change the sliding friction to rolling friction for the latch, Keep the high accuracy & long life for the clamshell lid.
Patent Technology 2: Pusher with adjustable design, protect the pogo pin & compatible eMMC devices tickness 0.8mm ~ 1.5mm
Patent Technology 3: Special latch design, very easy operation.  
Structure 1: Contacts with pogo pin, long life & stable performance.
Structure 2: Body with engineering plastic, high quality.
Structure 3: Floatingdesign, protect the pogo pin & high accurate positioning.
Structure 4: Contacts can be replaced, easy maintenance & low cost for the replacement.
Specification:
Mechanical
Socket Body: PPS
Socket Lid: Aluminum Alloy
Contact: Spring Probe
Operation Temperature: 0oC to 80oC
Life Span at Operating Travel:50K min.
Cycles Spring Force:24.5g per Pin
Electrical
Current Rating (Continuous) : 2A
DC Resistance: 100mohm