the device uses magnetic thickness measurement method, which non-destructively measures thickness of non-magnetic coating (such as: aluminum, chromium, copper, enamel, rubber, paint, etc.) on magnetic metal substrates (such as steel, iron, alloy and hard magnetic steel, etc.).

Magnetic Method (F-type probe)

When the probe contacts the cover layer, the probe and magnetic substrate forms a closed magnetic circuit; Due to the presence of non-magnetic coating, magnetic resistance changes. the thickness of the cover layer can be derived by measuring the change.

Eddy Current Method (NF-type probe)

When the probe contacts the cover layer, the probe and non-magnetic substrate forms Eddy Current and gives feedback to the coil inside the probe. the thickness of the cover layer can be derived by measuring the feedback.

Features

 1.Thickness measurement using both Magnetic Method and Eddy Current Method to measure the non-magnetic Coating on a magnetic metal substrate, or non-conductive coating on non-magnetic metal substrate.

 2.Single-point or two-point method could be used to correct probe system deviation, in order to ensure the

Accuracy of the device in the process of measuring.

 3.Fast automatic identification of iron and non-iron substrate.

 4.Power voltage indicator.

 5.Speaker beep while operating.

 6.Power-off automatically when idle; manually power-off available.

 7.Negative display function to ensure the accuracy of zero point calibration.

 8.Ultra-low power consumption, less than 10 uA in standby mode.

 

Technical Data

Model	GTS8202
Measuring range	0~1250um/0~50mil(default range)
Resolution	0.1um(0-99um)/1um(over 100um)
Accuracy	±1-3%n or ±2.5um
Min. Radius work piece	F: Convex 1.5mm/ Concave 25mm N: Convex 3mm/ Concave 50mm
Min. Measuring area	5mm
Min. Sample thickness	0.3mm
Power supply	2 x1.5V AA battery
Battery indicator	Low battery indicator
Dimension	102 x 66 x 24 mm

 

 

Item Checklist

Name	Quantity
Meter device	1
Standard films	5
Base substrate	2
Packing box	1
User Manual	1

 

Restore Factory Setting

 

(1)on power off state,

(2)press and hold the μm/mil key,

(3)then press the on button once, 

(4)release the μm/mil key. Screen should show " 8888",

(5)press the on button again, reset is done and power off.

 

Calibration Method

A)  Press and hold ê in the power off state and Press on key; then release on key first and then release the  ê Key. Screen should show CAL and flash <0.0 μm> to indicate that it's running at basic correction state.

B)  Measure a zero point. Measure a substrate without coating, and then press ZERO key, <0.0 μm> stops flashing on screen.

C)  Sequentially calibrate the 5 standard films, after each calibration, press the μm/mil key to confirm.

D)  during standard correction, thickness should increase in order, and one thickness can calibrate several times. the next thickness MUST be larger than 1.6 * the previous thickness, ideally 2; max measuring value should close to but not beyond maximum probe range. Note that last reading must be greater than 500 μm.

E)  after six points of calibration, measure a zero point; the device will automatically save calibration result and power off. On next power on, new calibration value will be used.