Measurement Range: | matrix:Fe,Cu,Ai,Ni,Zn,Sn,Ti,Mg |
---|---|
Wavelength Range: | 140-750nm |
Weight: | 130Kg (net weight), 180Kg (gross weight) |
Size: | 970*415*640 |
Brand Name: | Orient Spectrometer |
Place of Origin: | China (Mainland) |
Quick Details
Specifications
DF-410 full spectrum OES
Introduction
1) Czerny-Turner optical system is applied for a better plane CCD collection for all elemental wavelength that falls into 140-750nm.
2) Self-developed DF-IV collection device is able to collect all elemental wavelength between 140nm and 750nm.
3) Several matrices can be analyzed such as Fe, Cu, Ai, Zn, Ni, Sn, Ti, etc.
4) Module design for independent light collection, data processing and data optimization. with the help of high-performance ARM processor and real-time operational system, analytical time is largely shortened and accuracy is further improved.
5) 3G thermostatic system improves the energy efficiency to a great extent. The temperature fluctuation range of ±0.2℃ makes the DF-400 perform more stable.
6) the DF II-E digital-controlled light source broadens the elemental analytical range which covers trace elements, macro elements and elements with super high content.
7) Plane grating allows smaller number of CCD, further improving the accuracy and stability. It also occupies smaller space and makes set-up and movement a lot easier.
8) A whole new gas way; spark stand with cleaning function; adjustable master-slave gas ways equipped with a sealing device which prevents argon leakage; Quicker argon fulfillment.
9) the multipurpose operational software can meet various needs by displaying elemental data in a flexible way and supporting various printing formats.
Specifications
optiCal system |
Structure |
Czerny-Turner |
Curvature radius |
400mm | |
IV holographic original grating with aberration correction function |
2400 ruled lines/mm | |
wAvelength range |
140-750nm | |
pIxel resolution |
@200nm:7pm | |
Vacuum optical chamber with auto thermostatic system |
30±0.2℃ Vacuum range: 1.2-2.5 PA | |
lIght source system |
lIght source |
dIgital controlled Spark pulse |
cOntrol technique |
PWM | |
dIscharge current |
10-400A | |
eXcitation frequency |
100-800Hz | |
dIscharge duration |
10-10000μs | |
sPark stand |
Excitation chamber with minimum argon use | |
eAsily-changeable foundation(lid) | ||
mObile fixing pin | ||
dAta collection and control system |
CCD detector with high resolution | |
lInear CCD: Toshiba | ||
hIgh-speed 16-Bit A/D conversion | ||
rEsolution: 3648 pixel | ||
rEal-time control on temperature and vacuum state | ||
eThernet | ||
Others |
Matrices |
Fe, Cu, Ai, Ni, Zn, Sn, Ti, etc. |
cHannel configuration |
mUltiple matrices and channels | |
dImensions(mm) |
970*415*640 | |
eNvironmental requirement |
T 10℃-35℃ H 20%-80% | |
weight |
130Kg (net weight), 180Kg (gross weight) | |
V/F |
AC220V±10%/50Hz | |
power |
mAx 800VA Standby 100VA | |
argon |
pUrity≥99.994%,press≥0.3MPa |